15 October 2012 Electrical testing of the OLED matrix for analyzing defects in a PMOLED display
Author Affiliations +
Proceedings Volume 8549, 16th International Workshop on Physics of Semiconductor Devices; 854937 (2012) https://doi.org/10.1117/12.926781
Event: 16th International Workshop on Physics of Semiconductor Devices, 2011, Kanpur, India
Abstract
Organic Light Emitting Diode (OLED) based displays are viable alternative to Liquid Crystal Display (LCD) displays. However, OLED displays are still costlier due to the low yield of production which is due to the visual defects in the displays. A defect-free display is a prime requisite for a flat panel display application. Hence it becomes important to understand the possible defects and their root causes. Here, we have created defects intentionally in a small OLED matrix and studied the possible visual manifestations in a Passive Matrix Light Emitting Diode (PMOLED) display by electrically probing and visualizing waveforms on a Cathode-Ray Oscilloscope (CRO).
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pankaj Kr Uttwani, Pankaj Kr Uttwani, Asha Awasthi, Asha Awasthi, Ankur Solanki, Ankur Solanki, I. V. Kameshwar Rao, I. V. Kameshwar Rao, } "Electrical testing of the OLED matrix for analyzing defects in a PMOLED display", Proc. SPIE 8549, 16th International Workshop on Physics of Semiconductor Devices, 854937 (15 October 2012); doi: 10.1117/12.926781; https://doi.org/10.1117/12.926781
PROCEEDINGS
4 PAGES


SHARE
RELATED CONTENT


Back to Top