18 December 2012 Gaussian beam Z-scan analysis for nonlinear optical materials possessing simultaneous third- and fifth-order nonlinear refraction with saturable absorption: an application to semiconductor CdSe quantum dot-polymer nanocomposites
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Abstract
We present a theoretical analysis of the closed-aperture Gaussian beam Z-scan for nonlinear optical materials with both saturable absorption and simultaneous third- and fifth-order nonlinear refraction. We formulate a theoretical expression for the Z-scan transmittance by means of the Adomian’s decomposition method and the thin film approximation. It is applied to the experimental characterization of the nonlinear optical properties of a semiconductor CdSe quantum dot-polymer nanocomposite film. We show that measured results of the open- and closed-aperture Z-scan transmittances of the nanocomposite film are well explained by the theoretical model.
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Yasuo Tomita, Yasuo Tomita, Xiangming Liu, Xiangming Liu, Yusuke Adachi, Yusuke Adachi, } "Gaussian beam Z-scan analysis for nonlinear optical materials possessing simultaneous third- and fifth-order nonlinear refraction with saturable absorption: an application to semiconductor CdSe quantum dot-polymer nanocomposites", Proc. SPIE 8550, Optical Systems Design 2012, 85503G (18 December 2012); doi: 10.1117/12.979824; https://doi.org/10.1117/12.979824
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