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26 November 2012 Wave-front aberrations analysis by Zernike polynomials based on the annular sub-aperture stitching system
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Abstract
Annular sub-aperture stitching method was developed for testing large-aperture aspheric surfaces without using of any compensating element for measurement. It is necessary to correct measurement of aspheric optical aberrations and create mathematical description to describe wave-front aberrations. Zernike polynomials are suitable to describe wave aberration functions and data fitting of experimental measurements for the annular sub-aperture stitching system. This paper uses Zernike polynomials to describe the wave-front aberrations of full wave-front and reconstructed wave-front by annular sub-aperture stitching algorithm. At the same time, the imaging quality of the aspheric optical element can be contrasted. The stitching result shows good agreement with the full aperture result.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lei Duan, Mei Hui, Jiayuan Deng, Cheng Gong, and Yuejin Zhao "Wave-front aberrations analysis by Zernike polynomials based on the annular sub-aperture stitching system", Proc. SPIE 8557, Optical Design and Testing V, 855707 (26 November 2012); https://doi.org/10.1117/12.999563
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