30 November 2012 A SIFT feature based registration algorithm in automatic seal verification
Author Affiliations +
Abstract
A SIFT (Scale Invariant Feature Transform) feature based registration algorithm is presented to prepare for the seal verification, especially for the verification of high quality counterfeit sample seal. The similarities and the spatial relationships between the matched SIFT features are combined for the registration. SIFT features extracted from the binary model seal and sample seal images are matched according to their similarities. The matching rate is used to define the similar sample seal that is similar with its model seal. For the similar sample seal, the false matches are eliminated according to the position relationship. Then the homography between model seal and sample seal is constructed and named HS . The theoretical homography is namedH . The accuracy of registration is evaluated by the Frobenius norm of H-HS . In experiments, translation, filling and rotation transformations are applied to seals with different shapes, stroke number and structures. After registering the transformed seals and their model seals, the maximum value of the Frobenius norm of their H-HS is not more than 0.03. The results prove that this algorithm can accomplish accurate registration, which is invariant to translation, filling, and rotation transformation, and there is no limit to the seal shapes, stroke number and structures.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jin He, Xuewen Ding, Hao Zhang, Tiegen Liu, "A SIFT feature based registration algorithm in automatic seal verification", Proc. SPIE 8558, Optoelectronic Imaging and Multimedia Technology II, 85581R (30 November 2012); doi: 10.1117/12.999384; https://doi.org/10.1117/12.999384
PROCEEDINGS
10 PAGES


SHARE
Back to Top