5 December 2012 Effects of multiple reflections and low-frequency interferences on measured terahertz Fourier transform spectra
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Abstract
Fourier transform spectroscopy (FTS) is a measurement technique widely used in characterizing the spectrum of light sources and the frequency response of detectors. Some “ghost” spectral lines, however, are often observed in measured Fourier transform spectra, such as high-frequency harmonics of the light source due to multiple reflections in the measurement system and unexpected high frequency lines owing to low-frequency interferences in the data acquisition. Here we study the effects of multiple reflections and low-frequency interferences on the THz spectra measured by a Fourier transform spectrometer for different THz sources and detectors. Experimental and simulation results will be presented.
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Shao-Liang Li, Shao-Liang Li, Kang-Min Zhou, Kang-Min Zhou, Wen-Ying Duan, Wen-Ying Duan, Zhen-Hui Lin, Zhen-Hui Lin, Qi-Jun Yao, Qi-Jun Yao, Sheng-Cai Shi, Sheng-Cai Shi, } "Effects of multiple reflections and low-frequency interferences on measured terahertz Fourier transform spectra", Proc. SPIE 8562, Infrared, Millimeter-Wave, and Terahertz Technologies II, 856204 (5 December 2012); doi: 10.1117/12.999900; https://doi.org/10.1117/12.999900
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