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5 December 2012 Effects of multiple reflections and low-frequency interferences on measured terahertz Fourier transform spectra
Shao-Liang Li; Kang-Min Zhou; Wen-Ying Duan; Zhen-Hui Lin; Qi-Jun Yao; Sheng-Cai Shi
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Proceedings Volume 8562, Infrared, Millimeter-Wave, and Terahertz Technologies II; 856204 (2012) https://doi.org/10.1117/12.999900
Event: Photonics Asia, 2012, Beijing, China
Abstract
Fourier transform spectroscopy (FTS) is a measurement technique widely used in characterizing the spectrum of light sources and the frequency response of detectors. Some “ghost” spectral lines, however, are often observed in measured Fourier transform spectra, such as high-frequency harmonics of the light source due to multiple reflections in the measurement system and unexpected high frequency lines owing to low-frequency interferences in the data acquisition. Here we study the effects of multiple reflections and low-frequency interferences on the THz spectra measured by a Fourier transform spectrometer for different THz sources and detectors. Experimental and simulation results will be presented.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Shao-Liang Li, Kang-Min Zhou, Wen-Ying Duan, Zhen-Hui Lin, Qi-Jun Yao, and Sheng-Cai Shi "Effects of multiple reflections and low-frequency interferences on measured terahertz Fourier transform spectra", Proc. SPIE 8562, Infrared, Millimeter-Wave, and Terahertz Technologies II, 856204 (5 December 2012); https://doi.org/10.1117/12.999900
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