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5 December 2012 A novel target LOS calibration method for IR scanning sensor based on control points
Yong-Hong Xue; Wei An; Yin-Sheng Zhang; Tao Zhang
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Proceedings Volume 8562, Infrared, Millimeter-Wave, and Terahertz Technologies II; 85621F (2012) https://doi.org/10.1117/12.981716
Event: Photonics Asia, 2012, Beijing, China
Abstract
Space based IR system uses the information of target LOS (line of sight) for target location. Recent researches show that the measuring precision of target LOS is usually determined by measuring precision of platform’s position and attitude, and deformation of sensor etc. Most methods for improving target location precision are either through improving platform’s position and attitude measuring precision or through calib rating the whole image obtained by IR sensor. With the development of measuring technology, it is harder to make a further improvement on the measuring precision of position and attitude of the platform and the expansion of the sensor view make calibrat ion of the whole image with a larger computation cost. In this paper, a method using control points to calibrate target LOS was proposed. Based on the analysis of the imaging process of the scanning sensor of space based IR system, this paper established a modify model of target LOS based on control points, used a bias filter to estimate the bias value of sensor boresight, and finally achieved the mission of target LOS calibrat ion. Different from the traditional calibration method of remote sensing image, the proposed method only made a correct ion on the LOS of suspicious target, but not established the accurate relationship between the all pixels and their real location, and has a similar calibration performance, but more lower computational complexity.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Yong-Hong Xue, Wei An, Yin-Sheng Zhang, and Tao Zhang "A novel target LOS calibration method for IR scanning sensor based on control points", Proc. SPIE 8562, Infrared, Millimeter-Wave, and Terahertz Technologies II, 85621F (5 December 2012); https://doi.org/10.1117/12.981716
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