Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 8563, including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 8563", Proc. SPIE 8563, Optical Metrology and Inspection for Industrial Applications II, 856301 (7 January 2013); doi: 10.1117/12.2017914; https://doi.org/10.1117/12.2017914
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