Phase-function corrected diffusion model for diffuse reflectance of a pencil beam obliquely incident on a semi-infinite turbid medium

Roger J. Zemp

doi:10.1117/12.2005036

21 February 2013 Phase-function corrected diffusion model for diffuse reflectance of a pencil beam obliquely incident on a semi-infinite turbid medium

Roger J. Zemp

Author Affiliations +

Proceedings Volume 8592, Biomedical Applications of Light Scattering VII; 85920I (2013) https://doi.org/10.1117/12.2005036
Event: SPIE BiOS, 2013, San Francisco, California, United States

Abstract

Oblique incidence reflectometry (OIR) is an established technique for estimation of tissue optical properties, however, a sensing footprint of a few transport mean-free paths is often needed when diffusion-regime-based algorithms are used. Smaller-footprint probes require improved light-propagation models and inversion schemes for diffuse reflectance close to the point-of-entry but might enable micro-endoscopic form factors for clinical assessments of cancers and pre-cancers. In this paper we extend the phase-function corrected diffusion-theory presented by Vitkin et al. (Nat. Comm 2011) to the case of pencil beams obliquely incident on a semi-infinite turbid medium. The model requires minimal computational resources and offers improved accuracy over more traditional diffusion-theory approximations models when validated against Monte Carlo simulations. The computationally efficient nature of the models may lend themselves to rapid fitting procedures for inverse problems.

Citation Download Citation

Roger J. Zemp "Phase-function corrected diffusion model for diffuse reflectance of a pencil beam obliquely incident on a semi-infinite turbid medium", Proc. SPIE 8592, Biomedical Applications of Light Scattering VII, 85920I (21 February 2013); https://doi.org/10.1117/12.2005036

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