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22 February 2013 Wavefront measurement and data analysis of XUV HHG beam
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Abstract
Extensive measurements of wavefront profile of the coherent XUV (eXtreme Ultra-Violet) HHG (High-order Harmonics Generation) beam at the wavelength of 30 nm have been performed. Unique results have been achieved using the PDI (Point Diffraction Interferometer) technique. The basic principle of the PDI is straightforward – ultrathin aluminium foil with a miniature pinhole – and it benefits from the self-referencing feature which is very important due to the measured wavelength. On the other hand, fabrication and experimental measurements are in general difficult in this spectral domain. In this paper we present basic principles, experimental setup, alignment techniques, obtained data and their analysis.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. Homer, B. Rus, J. Hrebicek, and J. Nejdl "Wavefront measurement and data analysis of XUV HHG beam", Proc. SPIE 8600, Laser Resonators, Microresonators, and Beam Control XV, 860006 (22 February 2013); https://doi.org/10.1117/12.2004147
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