Efficient sensitivity analysis of waveguide structures using finite element method (FEM)

Mohamed R. Abdelhafez; Mohamed H. Bakr; Mohamed A. Swillam

doi:10.1117/12.2004826

14 March 2013 Efficient sensitivity analysis of waveguide structures using finite element method (FEM)

Mohamed R. Abdelhafez, Mohamed H. Bakr, Mohamed A. Swillam

Proceedings Volume 8619, Physics and Simulation of Optoelectronic Devices XXI; 86190M (2013) https://doi.org/10.1117/12.2004826
Event: SPIE OPTO, 2013, San Francisco, California, United States

Abstract

We discuss a novel finite element method-based technique for estimating accurate sensitivities of the desired response. Our technique utilizes the central adjoint variable method (CAVM) for estimating the response sensitivities. This approach features accuracy comparable to that of the central finite difference (CFD) approximation at the response level. Our approach uses a simple perturbation method to calculate the sensitivity of modal parameters of various waveguide structures with respect to the geometric and material parameters. No additional simulation is required to calculate the response and its sensitivity with respect to all the design parameters. The accuracy of our approach is illustrated by comparing the results with the second order accurate CFD applied on the response level. Our results show a very good agreement between the CAVM-based sensitivities and those obtained using the expensive central.

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Mohamed R. Abdelhafez, Mohamed H. Bakr, and Mohamed A. Swillam "Efficient sensitivity analysis of waveguide structures using finite element method (FEM)", Proc. SPIE 8619, Physics and Simulation of Optoelectronic Devices XXI, 86190M (14 March 2013); https://doi.org/10.1117/12.2004826

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KEYWORDS

Waveguides

Finite element methods

Fused deposition modeling

Matrices

Refractive index

Silicon

Wave propagation

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