Proceedings Volume 8626 is from: Logo
SPIE OPTO
2-7 February 2013
San Francisco, California, United States
Front Matter: Volume 8626
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 862601 (9 April 2013); doi: 10.1117/12.2024997
Transparent Conducting Oxides
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 862602 (18 March 2013); doi: 10.1117/12.2001287
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 862603 (18 March 2013); doi: 10.1117/12.2012865
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 862604 (18 March 2013); doi: 10.1117/12.2004359
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 862605 (18 March 2013); doi: 10.1117/12.2001613
Doping
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 862606 (18 March 2013); doi: 10.1117/12.2009394
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 862607 (18 March 2013); doi: 10.1117/12.2016508
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 862608 (18 March 2013); doi: 10.1117/12.2010085
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 862609 (18 March 2013); doi: 10.1117/12.2004460
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86260A (18 March 2013); doi: 10.1117/12.2004216
Photoresponsivity and Photodetectors
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86260B (18 March 2013); doi: 10.1117/12.2009247
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86260D (18 March 2013); doi: 10.1117/12.2002441
Strongly Correlated Complex Oxides
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86260F (18 March 2013); doi: 10.1117/12.2009086
ZnO-based Emitters
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86260L (18 March 2013); doi: 10.1117/12.2009999
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86260N (18 March 2013); doi: 10.1117/12.2002969
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86260O (18 March 2013); doi: 10.1117/12.2010036
Nanomaterials and Related Devices I
Nanomaterials and Related Devices II
Photovoltaic Applications
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86260X (18 March 2013); doi: 10.1117/12.2002976
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86260Y (18 March 2013); doi: 10.1117/12.2001290
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86260Z (18 March 2013); doi: 10.1117/12.2003138
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 862611 (18 March 2013); doi: 10.1117/12.2010046
Electronic and Structural Phase Transitions
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 862612 (18 March 2013); doi: 10.1117/12.2010105
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 862614 (18 March 2013); doi: 10.1117/12.2001809
Thin Film Transistors
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 862615 (18 March 2013); doi: 10.1117/12.2013277
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 862616 (18 March 2013); doi: 10.1117/12.2005528
Photonic Materials and Devices I
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 862618 (18 March 2013); doi: 10.1117/12.2013532
Photonic Materials and Devices II
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261A (18 March 2013); doi: 10.1117/12.2002090
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261B (18 March 2013); doi: 10.1117/12.2002913
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261C (18 March 2013); doi: 10.1117/12.2002005
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261D (18 March 2013); doi: 10.1117/12.2005169
Poster Session
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261F (18 March 2013); doi: 10.1117/12.2000315
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261G (18 March 2013); doi: 10.1117/12.2002862
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261H (18 March 2013); doi: 10.1117/12.2002885
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261I (18 March 2013); doi: 10.1117/12.2002894
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261J (18 March 2013); doi: 10.1117/12.2002979
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261K (18 March 2013); doi: 10.1117/12.2003029
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261L (18 March 2013); doi: 10.1117/12.2003166
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261N (18 March 2013); doi: 10.1117/12.2003474
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261O (18 March 2013); doi: 10.1117/12.2004173
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261P (18 March 2013); doi: 10.1117/12.2004659
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261Q (18 March 2013); doi: 10.1117/12.2004873
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261T (18 March 2013); doi: 10.1117/12.2005558
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261V (18 March 2013); doi: 10.1117/12.2008297
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261W (18 March 2013); doi: 10.1117/12.2008448
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261X (18 March 2013); doi: 10.1117/12.2013601
Proc. SPIE 8626, Oxide-based Materials and Devices IV, 86261Y (18 March 2013); doi: 10.1117/12.2014328
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