1 June 1988 Curvature Radius Measurement Of Reflecting Surfaces By Moire Deflectometry
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Proceedings Volume 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light; (1988) https://doi.org/10.1117/12.943505
Event: 1987 Symposium on the Technologies for Optoelectronics, 1987, Cannes, France
Abstract
Moire deflectometry allows one to measure minor angular deflections experienced by light beams, previously collimated, in general,for an easier metrologic decoding. A novel technique is presented aiming at the measurement of curvature radius of polished spherical surfaces. Theoretical studies and experimental results are presented revealing satisfactory agreement, while the sources of errors of the measuring technique are analyzed in detail. The theoretical model is extended to cover the measurement of the focal distance in lenses.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. F. Fernandez, J. F. Fernandez, O. D.D. Soares, O. D.D. Soares, M. Perez-Amor, M. Perez-Amor, J. Blanco, J. Blanco, } "Curvature Radius Measurement Of Reflecting Surfaces By Moire Deflectometry", Proc. SPIE 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light, (1 June 1988); doi: 10.1117/12.943505; https://doi.org/10.1117/12.943505
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