27 February 2013 Performance methodologies of a modular miniature photonic turn connector
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Proceedings Volume 8630, Optoelectronic Interconnects XIII; 863003 (2013) https://doi.org/10.1117/12.2006419
Event: SPIE OPTO, 2013, San Francisco, California, United States
Abstract
Next generation parallel optical interconnects that incorporate monolithic collimating lens arrays require new procedures and guidelines for performance certification and visual inspection. This paper, after reviewing design specifications, will report performance methodologies for a modular miniature photonic turn connector that is used as an interface into VCSEL and photodiode arrays. A new insertion loss test procedure is introduced that can be used to screen connector performance without the need for vendor-specific optical engines. Data will be presented to show how induced defects affect the connector performance and thus establish inspection criteria. Finally, recommended cleaning procedures will be addressed.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eric Childers, Eric Childers, DJ Hastings, DJ Hastings, Dirk Schoellner, Dirk Schoellner, Alan Ugolini, Alan Ugolini, Jillcha Wakjira, Jillcha Wakjira, } "Performance methodologies of a modular miniature photonic turn connector", Proc. SPIE 8630, Optoelectronic Interconnects XIII, 863003 (27 February 2013); doi: 10.1117/12.2006419; https://doi.org/10.1117/12.2006419
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