13 March 2013 Reliability and degradation of oxide VCSELs due to reaction to atmospheric water vapor
Author Affiliations +
Abstract
850nm oxide-aperture VCSELs are susceptible to premature failure if operated while exposed to atmospheric water vapor, and not protected by hermetic packaging. The ATLAS detector in CERN’s Large Hadron Collider (LHC) has had approximately 6000 channels of Parallel Optic VCSELs fielded under well-documented ambient conditions. Exact time-to-failure data has been collected on this large sample, providing for the first time actual failure data at use conditions. In addition, the same VCSELs were tested under a variety of accelerated conditions to allow us to construct a more accurate acceleration model. Failure analysis information will also be presented to show what we believe causes corrosion-related failure for such VCSELs.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexandru Dafinca, Anthony R. Weidberg, Steven J. McMahon, Alexander A. Grillo, Philippe Farthouat, Michael Ziolkowski, Robert W. Herrick, "Reliability and degradation of oxide VCSELs due to reaction to atmospheric water vapor", Proc. SPIE 8639, Vertical-Cavity Surface-Emitting Lasers XVII, 86390L (13 March 2013); doi: 10.1117/12.2001195; https://doi.org/10.1117/12.2001195
PROCEEDINGS
10 PAGES


SHARE
RELATED CONTENT

VCSEL reliability: a user's perspective
Proceedings of SPIE (March 14 2005)
Characterization of failure mechanisms for oxide VCSELs
Proceedings of SPIE (June 17 2003)
Developments at Finisar AOC
Proceedings of SPIE (January 29 2008)
AOC moving forward: the impact of materials behavior
Proceedings of SPIE (February 10 2006)
Imaging gate oxide ruptures
Proceedings of SPIE (January 14 1993)
In-situ sensors for product reliability monitoring
Proceedings of SPIE (April 19 2002)

Back to Top