System sharpness (STF) analysis of HD-OCT in 3D space using standard MTF methods

Horst Scherer; Rainer Nebosis; Malte Schulz; Marc Weber

doi:10.1117/12.2007566

6 March 2013 System sharpness (STF) analysis of HD-OCT in 3D space using standard MTF methods

Horst Scherer, Rainer Nebosis, Malte Schulz, Marc Weber

Proceedings Volume 8668, Medical Imaging 2013: Physics of Medical Imaging; 86684O (2013) https://doi.org/10.1117/12.2007566
Event: SPIE Medical Imaging, 2013, Lake Buena Vista (Orlando Area), Florida, United States

Abstract

For many applications of optical coherence tomography systems (OCT) optical resolution is a key feature. We present a method to determine the system transfer function (STF) of a full field high definition OCT (HD OCT). The measurement of the system sharpness is performed using structured glass edge phantoms, with a reflectivity adapted to the system dynamic range. After aligning the phantom within the field of view, a 3D image is recorded. A polynomial fit is applied to the 3D cube to extract the surface of the edge in space. In that way the image field curvature as well as the orientation of the surface in space are obtained. In a second step the intensity distribution of that surface is projected onto a plane using the polynomial fit parameters. Such a reconstructed planar phantom image allows a true 3D sharpness evaluation using standard MTF analysis. In this way the technical image sharpness during production can be monitored. This procedure- to our knowledge - was applied for the first time to a full 3D OCT (SKINTELL ). Such a HD-OCT is capable of producing a full 3D image with more than 325k parallel A-scans in only one fast sweep. The optimum sharpness in every depth position is ensured during the sweep by focus tracking.

Citation Download Citation

Horst Scherer, Rainer Nebosis, Malte Schulz, and Marc Weber "System sharpness (STF) analysis of HD-OCT in 3D space using standard MTF methods", Proc. SPIE 8668, Medical Imaging 2013: Physics of Medical Imaging, 86684O (6 March 2013); https://doi.org/10.1117/12.2007566

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KEYWORDS

Optical coherence tomography

3D image processing

Semiconducting wafers

3D metrology

Cameras

Glasses

Modulation transfer functions

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