11 December 2012 Ultrafast phenomena at the nanoscale: novel science opportunities at the SwissFEL X-ray Laser
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Proceedings Volume 8678, Short-Wavelength Imaging and Spectroscopy Sources; 867802 (2012) https://doi.org/10.1117/12.2011126
Event: Short-Wavelength Imaging and Spectroscopy, 2012, Bern, Switzerland
Abstract
Next-generation X-ray sources, based on the X-ray Free Electron Laser (XFEL) concept, will provide highly coherent, ultrashort pulses of soft and hard X-rays with peak intensity many orders of magnitude above that of a synchrotron. These pulses will allow studies of femtosecond dynamics at nanometer resolution and with chemical selectivity. They will produce coherent-diffraction images of organic and inorganic nanostructures without the deleterious effects of radiation damage.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. D. Patterson, B. D. Patterson, R. Abela, R. Abela, H.-H. Braun, H.-H. Braun, R. Ganter, R. Ganter, B. Pedrini, B. Pedrini, M. Pedrozzi, M. Pedrozzi, S. Reiche, S. Reiche, M. van Daalen, M. van Daalen, } "Ultrafast phenomena at the nanoscale: novel science opportunities at the SwissFEL X-ray Laser", Proc. SPIE 8678, Short-Wavelength Imaging and Spectroscopy Sources, 867802 (11 December 2012); doi: 10.1117/12.2011126; https://doi.org/10.1117/12.2011126
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