11 December 2012 Using submicron-resolution LiF crystal and film x-ray detectors for the near and far fields in-situ characterization of soft x-ray laser beams
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Proceedings Volume 8678, Short-Wavelength Imaging and Spectroscopy Sources; 86780B (2012) https://doi.org/10.1117/12.2003489
Event: Short-Wavelength Imaging and Spectroscopy, 2012, Bern, Switzerland
Abstract
Review of results, obtained by using recently proposed new imaging detector, based on formation of color centers in LiF crystal and LiF film, for in situ high performance measurements of near-field and far-field properties of soft X-ray lasers (SXRL) beams is presented. Experiments have been carried out with laser-driven transient-collision plasma SXRL and free electron SXRL beams. It was demonstrated that due to favorable combination of high spatial resolution, high dynamic range and wide field of view this technique allows measuring not only intensity distribution across the full beam and in local areas, but also permits to evaluate coherence and spectral distribution of radiation across the beam. Experimental diffraction patterns in the images of periodical structures are analyzed by comparison with the modeled ones in the last case. The estimated accuracy of measurements is between 10-20%.
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Tatiana A. Pikuz, Tatiana A. Pikuz, Anatoly Ya. Faenov, Anatoly Ya. Faenov, Yuji Fukuda, Yuji Fukuda, Yoshiaki Kato, Yoshiaki Kato, Tetsuya Kawachi, Tetsuya Kawachi, Masaki Kando, Masaki Kando, } "Using submicron-resolution LiF crystal and film x-ray detectors for the near and far fields in-situ characterization of soft x-ray laser beams", Proc. SPIE 8678, Short-Wavelength Imaging and Spectroscopy Sources, 86780B (11 December 2012); doi: 10.1117/12.2003489; https://doi.org/10.1117/12.2003489
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