11 December 2012 Elemental analysis with x-ray fluorescence spectrometry
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Proceedings Volume 8678, Short-Wavelength Imaging and Spectroscopy Sources; 86780D (2012) https://doi.org/10.1117/12.2010944
Event: Short-Wavelength Imaging and Spectroscopy, 2012, Bern, Switzerland
Abstract
Elemental analysis by means of X-ray fluorescence (XRF) spectrometry is based on the element-specific electro- magnetic radiation induced as a consequence of inner-shell ionization. XRF spectrometry is ideal for the direct analysis of solid samples, but can also investigate fluid samples. On one side, these methods allow the rapid qualitative screening of unknown samples, without any particular sample preparation. On the other hand, it is possible to perform the fully automated quantitative analysis of large sample sets. Further figures of merit are the ’standard-less’ analysis of samples in a non-destructive mode, and detection down to 0.01 %. The availability of portable XRF systems6 is a further advantage for on-site measurements. The fundamentals are discussed to orient the user, and a survey of instrumental capabilities is provided.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter Lienemann, Davide Bleiner, "Elemental analysis with x-ray fluorescence spectrometry", Proc. SPIE 8678, Short-Wavelength Imaging and Spectroscopy Sources, 86780D (11 December 2012); doi: 10.1117/12.2010944; https://doi.org/10.1117/12.2010944
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