11 December 2012 X-ray spectromicroscopy
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Proceedings Volume 8678, Short-Wavelength Imaging and Spectroscopy Sources; 86780E (2012) https://doi.org/10.1117/12.2009660
Event: Short-Wavelength Imaging and Spectroscopy, 2012, Bern, Switzerland
Abstract
X-ray spectroscopy is a powerful tool for diagnosing the emission characteristics of X-ray sources. It may also be used in characterizing the elemental and chemical states present in compound materials, including the spatial distribution of these states – spectromicroscopy. This paper describes the appropriate spectroscopic techniques along with examples of their uses – the characterization of laser-plasma sources and the study of chemical state distributions in medium density fibreboard. The possibility of using laboratory-scale sources for spectromicroscopy, as opposed to synchrotrons, are discussed, taking into account the signal to noise ratios that are required to provide the necessary precision.
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Alan Michette, Alan Michette, } "X-ray spectromicroscopy", Proc. SPIE 8678, Short-Wavelength Imaging and Spectroscopy Sources, 86780E (11 December 2012); doi: 10.1117/12.2009660; https://doi.org/10.1117/12.2009660
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