11 April 2013 Filter-based interrogation unit for optical wavelength shift sensors
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Abstract
We present a filter-based spectrometer consisting of a dielectric thin film filter with a lateral-spectral transmission gradient (linear variable filter) and a position detector which allows high resolution in wavelength shift registration. The resolving capacity of two interrogation unit variants (with segmented and homogeneous position detector, respectively) is examined using a monochromatic tunable light source. On the basis of the obtained results, we discuss several advantages and drawbacks of this interrogation approach.
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Roland Wuchrer, Roland Wuchrer, Thomas Härtling, Thomas Härtling, } "Filter-based interrogation unit for optical wavelength shift sensors", Proc. SPIE 8693, Smart Sensor Phenomena, Technology, Networks, and Systems Integration 2013, 869304 (11 April 2013); doi: 10.1117/12.2009093; https://doi.org/10.1117/12.2009093
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