Laser scanning confocal microscopy in materials engineering

Jan Tomáštík; Hana Šebestová; Radim Čtvrtlík; Petr Schovánek

doi:10.1117/12.2010259

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18 December 2012 Laser scanning confocal microscopy in materials engineering

Jan Tomáštík, Hana Šebestová, Radim Čtvrtlík, Petr Schovánek

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Proceedings Volume 8697, 18th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics; 869710 (2012) https://doi.org/10.1117/12.2010259
Event: 18th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 2012, Ostravice, Czech Republic

Abstract

In materials engineering, we are often faced with a necessity to display the shape and morphology of studied surfaces. This is essential for surface evaluation of various components as well as for new materials research. Several imaging techniques are available for such purposes. One of the most appropriate of them is laser scanning confocal microscopy. The magnification range of this technique satisfies the needs of researchers working between the limits of conventional optical microscopes and scanning electron microscopes. It overcomes the limitations of optical microscopy by better lateral resolution, ability to control the depth of field and possibility of high-resolution 3D imaging of relatively thick samples. Compared to the more advanced (and more expensive) scanning electron microscopes, laser scanning confocal microscopy has no special requirement for the sample preparation and there is also no need to measure in vacuum. Particular examples of laser scanning confocal microscopy beneficial use are presented in this paper. Scratch track evaluation, diamonds tip control, Tyvek structure examination and measurement of surface characteristics of a wire saw cut on the glass are reported.

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Jan Tomáštík, Hana Šebestová, Radim Čtvrtlík, and Petr Schovánek "Laser scanning confocal microscopy in materials engineering", Proc. SPIE 8697, 18th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 869710 (18 December 2012); https://doi.org/10.1117/12.2010259

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