18 December 2012 Several examples of using contact profilometer for optical surface mapping
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Proceedings Volume 8697, 18th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics; 86972G (2012) https://doi.org/10.1117/12.2010362
Event: 18th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 2012, Ostravice, Czech Republic
Abstract
The number of devices and methods for non-contact solid surface measurement and mapping is growing. Nevertheless contact devices still have value in measuring roughness, waviness and shape measurement. Modern contact devices measure without any negative influence to the surface and are even used for optical and other sensitive surfaces. Some examples are mentioned in the article below.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Havelková, M. Havelková, H. Hiklová, H. Hiklová, "Several examples of using contact profilometer for optical surface mapping", Proc. SPIE 8697, 18th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 86972G (18 December 2012); doi: 10.1117/12.2010362; https://doi.org/10.1117/12.2010362
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