PROCEEDINGS VOLUME 8700
INTERNATIONAL CONFERENCE ON MICRO-AND NANO-ELECTRONICS 2012 | 1-5 OCTOBER 2012
International Conference Micro- and Nano-Electronics 2012
INTERNATIONAL CONFERENCE ON MICRO-AND NANO-ELECTRONICS 2012
1-5 October 2012
Zvenlgorod, Russian Federation
Front Matter: Volume 8700
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 870001 (8 January 2013); doi: 10.1117/12.2019787
Plasma and Thermal Processing
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 870002 (10 January 2013); doi: 10.1117/12.2017609
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 870003 (8 January 2013); doi: 10.1117/12.2017138
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 870004 (3 January 2013); doi: 10.1117/12.2017556
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 870005 (3 January 2013); doi: 10.1117/12.2016882
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 870006 (3 January 2013); doi: 10.1117/12.2018016
Micro- and Nanoelectronic Structures
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 870007 (3 January 2013); doi: 10.1117/12.2017272
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 870008 (3 January 2013); doi: 10.1117/12.2016834
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 870009 (3 January 2013); doi: 10.1117/12.2017068
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000A (8 January 2013); doi: 10.1117/12.2017719
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000B (8 January 2013); doi: 10.1117/12.2017239
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000C (8 January 2013); doi: 10.1117/12.2017106
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000D (8 January 2013); doi: 10.1117/12.2017023
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000E (8 January 2013); doi: 10.1117/12.2018205
Magnetic and Superconducting Structures
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000F (8 January 2013); doi: 10.1117/12.2016920
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000G (8 January 2013); doi: 10.1117/12.2017337
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000H (8 January 2013); doi: 10.1117/12.2017638
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000I (8 January 2013); doi: 10.1117/12.2017882
Micro- and Nanoscale Devices
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000J (8 January 2013); doi: 10.1117/12.2017063
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000K (18 July 2013); doi: 10.1117/12.2017548
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000L (18 July 2013); doi: 10.1117/12.2017618
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000M (8 January 2013); doi: 10.1117/12.2016911
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000N (8 January 2013); doi: 10.1117/12.2017358
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000O (8 January 2013); doi: 10.1117/12.2017090
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000P (8 January 2013); doi: 10.1117/12.2017876
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000Q (8 January 2013); doi: 10.1117/12.2018388
Microelectromechanical Systems
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000R (8 January 2013); doi: 10.1117/12.2016968
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000S (8 January 2013); doi: 10.1117/12.2016751
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000T (8 January 2013); doi: 10.1117/12.2016784
Characterization and Metrology
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000U (8 January 2013); doi: 10.1117/12.2017079
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000V (8 January 2013); doi: 10.1117/12.2017156
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000W (8 January 2013); doi: 10.1117/12.2016850
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000X (8 January 2013); doi: 10.1117/12.2016977
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000Y (8 January 2013); doi: 10.1117/12.2016917
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87000Z (8 January 2013); doi: 10.1117/12.2016999
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 870010 (10 January 2013); doi: 10.1117/12.2017529
Simulation and Modeling
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 870011 (8 January 2013); doi: 10.1117/12.2017060
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 870012 (8 January 2013); doi: 10.1117/12.2017154
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 870013 (8 January 2013); doi: 10.1117/12.2016758
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 870014 (8 January 2013); doi: 10.1117/12.2016757
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 870015 (8 January 2013); doi: 10.1117/12.2017078
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 870016 (8 January 2013); doi: 10.1117/12.2017550
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 870017 (8 January 2013); doi: 10.1117/12.2017306
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 870018 (8 January 2013); doi: 10.1117/12.2016966
Quantum Informatics
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 870019 (8 January 2013); doi: 10.1117/12.2017396
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87001A (8 January 2013); doi: 10.1117/12.2017414
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87001B (8 January 2013); doi: 10.1117/12.2017517
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87001C (8 January 2013); doi: 10.1117/12.2017619
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87001D (3 January 2013); doi: 10.1117/12.2016982
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87001E (3 January 2013); doi: 10.1117/12.2017104
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87001F (3 January 2013); doi: 10.1117/12.2017727
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87001G (3 January 2013); doi: 10.1117/12.2016983
Proc. SPIE 8700, International Conference Micro- and Nano-Electronics 2012, 87001H (3 January 2013); doi: 10.1117/12.2016639
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