22 January 2013 Method of m-line spectroscopy, a good tool to determine and control the optical parameters of waveguide structures
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Proceedings Volume 8702, Laser Technology 2012: Progress in Lasers; 870207 (2013) https://doi.org/10.1117/12.2010911
Event: Tenth Symposium on Laser Technology, 2012, Szczecin, Poland
Abstract
Method of spectroscopy m-line is an accurate method for determination of the optical parameters of the planar and stripe waveguides. In this method, the laser beam is coupled to the waveguide (e.g. by the prism) in the form of discrete angles. If the layer of the solid or liquid material is deposited on the waveguide, the change in the coupling angle is observed. Modified method of the m-line spectroscopy allows for determination of the optical parameters of deposited layers with high accuracy. Moreover, modification of the waveguide structure obtained via deposition of consecutive layers and changes the ability to propagate not only in the same waveguide. Modified method of m-line spectroscopy has found many potential applications in various areas such as: technological control of the applied layers quality; modification of the light propagation in the waveguide structures; utilization in the preventive medicine for diabetic diseases; food-control of the level of nutrients in vegetables (e.g. sugar level in white beets).
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Elżbieta Auguściuk, Elżbieta Auguściuk, } "Method of m-line spectroscopy, a good tool to determine and control the optical parameters of waveguide structures", Proc. SPIE 8702, Laser Technology 2012: Progress in Lasers, 870207 (22 January 2013); doi: 10.1117/12.2010911; https://doi.org/10.1117/12.2010911
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