18 June 2013 Temperature dependence of 1/f noise, defects, and dark current in small pitch MWIR and LWIR HDVIP® HgCdTe FPAs
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Abstract
Reducing an array’s pixel pitch reduces the size and weight of the focal plane array (FPA) and its associated dewar, cooler and optics. Higher operating temperatures reduce cool-down time and cooler power, enabling reduced cooler size and weight. High operating temperature small pitch (≤15 um) infrared detectors are therefore highly desirable. We have characterized a large number of MWIR and LWIR FPAs as a function of temperature and cutoff wavelength to determine the impact of these parameters on the FPA’s dark current, 1/f noise and defects. The 77K cutoff wavelength range for the MWIR arrays was 5.0-5.6 um, and 8.5-11 um for the LWIR arrays. DRS’ HDVIP® FPAs are based on a front-side illuminated, via interconnected, cylindrical geometry, N+/N/P architecture. An FPA’s 1/f noise is manifested as a tail in the FPA’s rmsnoise distribution. We have found that the model-independent nonparametric skew [(mean–median)/standard deviation] of the rmsnoise distribution is a highly effective tool for quantifying the magnitude of an FPA’s 1/f noise tail. In this paper we show that a standard FPA’s 1/f noise varies as ni (the intrinsic carrier concentration), in agreement with models that treat dislocations as donor pipes located within the P-volume of the unit cell. Nonstandard FPAs have been observed with systemic 1/f noise which varies as ni2.
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Roger L. Strong, Michael A. Kinch, John M. Armstrong, "Temperature dependence of 1/f noise, defects, and dark current in small pitch MWIR and LWIR HDVIP® HgCdTe FPAs", Proc. SPIE 8704, Infrared Technology and Applications XXXIX, 87042O (18 June 2013); doi: 10.1117/12.2015816; https://doi.org/10.1117/12.2015816
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