Crack detection using induction thermography during high-temperature testing

M. Genest; D. C. Dudzinski; L. Dawag; R. K. Kersey

doi:10.1117/12.2015488

22 May 2013 Crack detection using induction thermography during high-temperature testing

M. Genest, D. C. Dudzinski, L. Dawag, R. K. Kersey

Proceedings Volume 8705, Thermosense: Thermal Infrared Applications XXXV; 87050P (2013) https://doi.org/10.1117/12.2015488
Event: SPIE Defense, Security, and Sensing, 2013, Baltimore, Maryland, United States

Abstract

Thermo-mechanical fatigue (TMF) tests and strain to crack (SC) tests at elevated temperature are important aspects to the total fatigue life for many engineering applications. During a TMF test, crack inspections are commonly done in a disruptive manner using an acetate replication method; and post-test crack evaluations are done using both optical and scanning electronic microscopy methods. Similarly, inspections during a typical SC test are also performed in a disruptive manner. This paper demonstrates that infrared imaging can be used as an in-situ inspection approach to detect crack during TMF and SC tests at high temperature. It is also demonstrated that this technique allows for the reduction or elimination of the need for downtime that is typically required for disruptive inspection. The results obtained by induction thermography are compared to those obtained via traditional methods and post-test evaluation. The induction thermography inspections were carried out at several temperatures and showed that the temperature used during the test does not influence the crack detection capability. It is demonstrated that induction thermography can detect cracks smaller than 500 μm and has potential for monitoring and generating a crack growth curve.

Citation Download Citation

M. Genest, D. C. Dudzinski, L. Dawag, and R. K. Kersey "Crack detection using induction thermography during high-temperature testing", Proc. SPIE 8705, Thermosense: Thermal Infrared Applications XXXV, 87050P (22 May 2013); https://doi.org/10.1117/12.2015488

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available