PROCEEDINGS VOLUME 8729
SPIE DEFENSE, SECURITY, AND SENSING | 29 APRIL - 3 MAY 2013
Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Proceedings Volume 8729 is from: Logo
SPIE DEFENSE, SECURITY, AND SENSING
29 April - 3 May 2013
Baltimore, Maryland, United States
Front Matter: Volume 8729
Proc. SPIE 8729, Front Matter: Volume 8729, 872901 (4 June 2013); doi: 10.1117/12.2031983
Opening Keynote Session
Proc. SPIE 8729, Scanning electron microscopy/energy dispersive spectrometry fixedbeam or overscan x-ray microanalysis of particles can miss the real structure: x-ray spectrum image mapping reveals the true nature, 872902 (29 May 2013); doi: 10.1117/12.2011790
Proc. SPIE 8729, Does your SEM really tell the truth? Part 2, 872903 (29 May 2013); doi: 10.1117/12.2014936
Proc. SPIE 8729, Electron microscopy and forensic practice, 872904 (29 May 2013); doi: 10.1117/12.2016188
Advancements in Scanning Probe Microscopy
Proc. SPIE 8729, A large range metrological atomic force microscope and its uncertainty analysis, 872905 (29 May 2013); doi: 10.1117/12.2017674
Proc. SPIE 8729, Performance improvement of a large range metrological AFM through parasitic interference feedback artifacts removing by using laser multimode modulation method, 872906 (29 May 2013); doi: 10.1117/12.2015663
STEM Workshop
Proc. SPIE 8729, HTA educational outreach program and change the equation participation, 87290B (29 May 2013); doi: 10.1117/12.2018284
Proc. SPIE 8729, Bringing students to the mountain: developing partnerships to introduce students to cutting-edge research, 87290C (29 May 2013); doi: 10.1117/12.2018232
Proc. SPIE 8729, Using the Hitachi TM 3000 in a middle school classroom, 87290D (29 May 2013); doi: 10.1117/12.2016185
Proc. SPIE 8729, Implementing STEM technology in a Title One middle school classroom, 87290E (29 May 2013); doi: 10.1117/12.2016152
Proc. SPIE 8729, Integrating independent research into science curricula to foster STEM leadership, 87290F (29 May 2013); doi: 10.1117/12.2015991
Advancements in Scanning Microscopies
Proc. SPIE 8729, Advances in photo-thermal infrared imaging microspectroscopy, 87290H (29 May 2013); doi: 10.1117/12.2015990
Proc. SPIE 8729, Surface optical properties for copper based on surface Kramers-Kroning analysis, 87290I (29 May 2013); doi: 10.1117/12.2016266
Particle Beam Interaction Modeling Workshop
Proc. SPIE 8729, Monte Carlo simulation of realistic beam-sample interaction in SEM: application to evaluation of sharpness measurement methods, 87290J (29 May 2013); doi: 10.1117/12.2015357
Proc. SPIE 8729, Monte Carlo study of the influence of electron beam focusing to SEM linewidth measurement, 87290K (29 May 2013); doi: 10.1117/12.2015358
Proc. SPIE 8729, Monte Carlo simulation of x-ray photoemission electron microscopic image, 87290L (29 May 2013); doi: 10.1117/12.2016301
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