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Scanning electron microscopy/energy dispersive spectrometry fixedbeam or overscan x-ray microanalysis of particles can miss the real structure: x-ray spectrum image mapping reveals the true nature
Performance improvement of a large range metrological AFM through parasitic interference feedback artifacts removing by using laser multimode modulation method
Bringing students to the mountain: developing partnerships to introduce students to cutting-edge research
Monte Carlo simulation of realistic beam-sample interaction in SEM: application to evaluation of sharpness measurement methods