29 May 2013 Flexible digital x-ray technology for far-forward remote diagnostic and conformal x-ray imaging applications
Author Affiliations +
Abstract
Today’s flat panel digital x-ray image sensors, which have been in production since the mid-1990s, are produced exclusively on glass substrates. While acceptable for use in a hospital or doctor’s office, conventional glass substrate digital x-ray sensors are too fragile for use outside these controlled environments without extensive reinforcement. Reinforcement, however, significantly increases weight, bulk, and cost, making them impractical for far-forward remote diagnostic applications, which demand rugged and lightweight x-ray detectors. Additionally, glass substrate x-ray detectors are inherently rigid. This limits their use in curved or bendable, conformal x-ray imaging applications such as the non-destructive testing (NDT) of oil pipelines. However, by extending low-temperature thin-film transistor (TFT) technology previously demonstrated on plastic substrate- based electrophoretic and organic light emitting diode (OLED) flexible displays, it is now possible to manufacture durable, lightweight, as well as flexible digital x-ray detectors. In this paper, we discuss the principal technical approaches used to apply flexible display technology to two new large-area flexible digital x-ray sensors for defense, security, and industrial applications and demonstrate their imaging capabilities. Our results include a 4.8″ diagonal, 353 x 463 resolution, flexible digital x-ray detector, fabricated on a 6″ polyethylene naphthalate (PEN) plastic substrate; and a larger, 7.9″ diagonal, 720 x 640 resolution, flexible digital x-ray detector also fabricated on PEN and manufactured on a gen 2 (370 x 470 mm) substrate.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joseph Smith, Joseph Smith, Michael Marrs, Michael Marrs, Mark Strnad, Mark Strnad, Raj B. Apte, Raj B. Apte, Julie Bert, Julie Bert, David Allee, David Allee, Nicholas Colaneri, Nicholas Colaneri, Eric Forsythe, Eric Forsythe, David Morton, David Morton, "Flexible digital x-ray technology for far-forward remote diagnostic and conformal x-ray imaging applications", Proc. SPIE 8730, Flexible Electronics, 87300F (29 May 2013); doi: 10.1117/12.2016102; https://doi.org/10.1117/12.2016102
PROCEEDINGS
7 PAGES


SHARE
RELATED CONTENT

X ray light valve (XLV) a novel detectors' technology...
Proceedings of SPIE (March 18 2014)
After emission in microchannel plate detectors
Proceedings of SPIE (October 31 1990)
X-ray matrix sensors
Proceedings of SPIE (April 29 1999)

Back to Top