A new system parameters analysis method to improve image quality in digital microscopic hologram reconstruction

Jiansu Li; Zhao Wang; Jianmin Gao; Kun Chen; Yun Liu

doi:10.1117/12.2015563

17 May 2013 A new system parameters analysis method to improve image quality in digital microscopic hologram reconstruction

Jiansu Li, Zhao Wang, Jianmin Gao, Kun Chen, Yun Liu

Author Affiliations +

Proceedings Volume 8738, Three-Dimensional Imaging, Visualization, and Display 2013; 87380Y (2013) https://doi.org/10.1117/12.2015563
Event: SPIE Defense, Security, and Sensing, 2013, Baltimore, Maryland, United States

Abstract

In order to obtain the non-overlapping and high-quality reconstructed image, this paper analyzes the system parameters in digital holographic microscopy. Nowadays a few scholars have analyzed the system parameters which need to satisfy the sampling theorem and spectrum separation conditions. In this paper, not only the sampling theorem and spectrum separation but also the size relationship between the reconstructed plane and the magnified image are studied. Then relationships of system parameters are proposed. First, the maximum object size is directly proportional to the wavelength and microscope objective focal length, inversely proportional to the sampling interval. Second, the minimum magnification is described accurately. Finally, the paper gives the range of recoding distance. Experiments further demonstrate the proposed conclusion’s validity.

Citation Download Citation

Jiansu Li, Zhao Wang, Jianmin Gao, Kun Chen, and Yun Liu "A new system parameters analysis method to improve image quality in digital microscopic hologram reconstruction", Proc. SPIE 8738, Three-Dimensional Imaging, Visualization, and Display 2013, 87380Y (17 May 2013); https://doi.org/10.1117/12.2015563

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