3D measurement based on phase-shift and self-calibration

Liangzhou Chen; Yongjie Xu; Dan Xiao

doi:10.1117/12.2014579

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31 January 2013 3D measurement based on phase-shift and self-calibration

Liangzhou Chen, Yongjie Xu, Dan Xiao

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Proceedings Volume 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation; 87591A (2013) https://doi.org/10.1117/12.2014579
Event: International Symposium on Precision Engineering Measurement and Instrumentation 2012, 2012, Chengdu, China

Abstract

Non-contact three-dimension (3D) measurement technology has developed rapidly. Digital grating projection is regarded as the best prospect one. There are many problems, such as low accuracy, which have not been solved yet. Based on digital grating phase-shift, and combed with height-phase mapping and self lattice calibrating, a new 3D measurement method has been proposed. With little geometric constraints to digital grating and CCD, the measurement system is more feasible, which can be used to realize the accurate measurement and reconstruction according to the 3D information from measured object. By applying the method proposed to a reference object, the experience has lead to good result which shows that the new method is efficient and precision.

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Liangzhou Chen, Yongjie Xu, and Dan Xiao "3D measurement based on phase-shift and self-calibration", Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 87591A (31 January 2013); https://doi.org/10.1117/12.2014579

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