22 June 2013 A reference workpiece for voxel size correction in x-ray computed tomography
Author Affiliations +
Proceedings Volume 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013); 87690E (2013) https://doi.org/10.1117/12.2020916
Event: International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 2013, Singapore, Singapore
Abstract
X-ray computed tomography (CT) is increasingly used for dimensional metrology, allowing the inspection of both interior and exterior features impossible to observe using traditional optical and tactile measurement techniques. X-ray CT offers many benefits over traditional instruments as a visual inspection tool, however, extracting dimensional information from the reconstructed data-sets must be approached with caution due to error sources that can propagate through the image reconstruction processes. One error source originates from values of the source-to-object and source-to-detector distances; these are critical inputs as they define the voxel size, a global scalar directly influencing all dimensions extracted from the data. To reduce voxel size errors a reference workpiece can be scanned using the same measurement settings as the actual workpiece. By reconstructing the reference workpiece a reference dimension can be evaluated and this then used to adjust the voxel size of the actual workpiece. This reference dimension must be threshold independent, namely it is determined without the influence of edge detection thresholds. This paper offers a reference workpiece designed for measurement in an X-ray CT system, a coordinate measuring machine (CMM), and an optical profiler. Repeated measurements are made of the reference workpiece using all three instruments and
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joseph J. Lifton, Kevin J. Cross, Andrew A. Malcolm, John W. McBride, "A reference workpiece for voxel size correction in x-ray computed tomography", Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87690E (22 June 2013); doi: 10.1117/12.2020916; https://doi.org/10.1117/12.2020916
PROCEEDINGS
8 PAGES


SHARE
RELATED CONTENT

Seventh-generation CT
Proceedings of SPIE (March 31 2016)
Lab-based x-ray nanoCT imaging
Proceedings of SPIE (March 09 2017)
CT number variations in micro CT imaging systems
Proceedings of SPIE (March 18 2008)

Back to Top