You have requested a machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Neither SPIE nor the owners and publishers of the content make, and they explicitly disclaim, any express or implied representations or warranties of any kind, including, without limitation, representations and warranties as to the functionality of the translation feature or the accuracy or completeness of the translations.
Translations are not retained in our system. Your use of this feature and the translations is subject to all use restrictions contained in the Terms and Conditions of Use of the SPIE website.
22 June 2013Measurement of the shape of objects by two wavelength interferometry
We propose a fast and precise optical 3D measurement method. The principle is similar to that of white-light
interferometry. The broad-band light source of white-light interferometry is replaced by two lasers with different
wavelengths. The object to be measured is placed into one arm of a Michelson interferometer and moved along the
optical axis. The intensity measured at the output of the interferometer is equal to the field autocorrelation. In the case of
two wavelengths, the autocorrelation is a periodical function with peaks as a result of their beating. The period can be
adjusted by the choice of the wavelength difference. By choosing a short period, a fast and precise measurement is
performed in the range of a single beat. However, such a measurement is ambiguous if the object has structures deeper
than the beat period. The ambiguity is removed by a fast auxiliary measurement with a long beat period covering the
whole depth range of the object. The auxiliary measurement need not be precise and can be completed quickly with a
large sampling step.
Pavel Pavlíček andDinesh N. Naik
"Measurement of the shape of objects by two wavelength interferometry", Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87690H (22 June 2013); https://doi.org/10.1117/12.2019001
The alert did not successfully save. Please try again later.
Pavel Pavlíček, Dinesh N. Naik, "Measurement of the shape of objects by two wavelength interferometry," Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87690H (22 June 2013); https://doi.org/10.1117/12.2019001