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22 June 2013 Estimation of the sampling interval error for LED measurement with a goniophotometer
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Proceedings Volume 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013); 87690N (2013) https://doi.org/10.1117/12.2021051
Event: International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 2013, Singapore, Singapore
Abstract
Using a goniophotometer to implant a total luminous flux measurement, an error comes from the sampling interval, especially in the situation for LED measurement. In this work, we use computer calculations to estimate the effect of sampling interval on the measuring the total luminous flux for four typical kinds of LEDs, whose spatial distributions of luminous intensity is similar to those LEDs shown in CIE 127 paper. Four basic kinds of mathematical functions are selected to simulate the distribution curves. Axial symmetric type LED and non-axial symmetric type LED are both take amount of. We consider polar angle sampling interval of 0.5°, 1°, 2°, and 5° respectively in one rotation for axial symmetric type, and consider azimuth angle sampling interval of 18°, 15°, 12°, 10° and 5° respectively for non-axial symmetric type. We noted that the error is strongly related to spatial distribution. However, for common LED light sources the calculation results show that a usage of polar angle sampling interval of 2° and azimuth angle sampling interval of 15° is recommended. The systematic error of sampling interval for a goniophotometer can be controlled at the level of 0.3%. For high precise level, the usage of polar angle sampling interval of 1° and azimuth angle sampling interval of 10° should be used.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Weiqiang Zhao, Hui Liu, and Jian Liu "Estimation of the sampling interval error for LED measurement with a goniophotometer", Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87690N (22 June 2013); https://doi.org/10.1117/12.2021051
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