22 June 2013 Systematic errors in digital image correlation induced by environment temperature variation around the digital camera
Author Affiliations +
Proceedings Volume 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013); 87690Q (2013) https://doi.org/10.1117/12.2019198
Event: International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 2013, Singapore, Singapore
Abstract
The systematic strain measurement error in Digital Image Correlation (DIC) induced by the environment temperature variation around the digital camera was extensively studied. The temperature variation of different camera components along with the changes of the environment temperature is experimentally studied and the motions of different components are then analyzed. The strain error in DIC is then analyzed according to a physical model to express the imaging geometry changes. Finally, the DIC measurement error caused by environment temperature variation was experimentally verified.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qinwei Ma, Shaopeng Ma, Yongfa Zhang, "Systematic errors in digital image correlation induced by environment temperature variation around the digital camera", Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87690Q (22 June 2013); doi: 10.1117/12.2019198; https://doi.org/10.1117/12.2019198
PROCEEDINGS
6 PAGES


SHARE
Back to Top