Paper
22 June 2013 Characteristic evaluation of linear LED grating projector for high-speed shape measurement
Author Affiliations +
Proceedings Volume 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013); 87691J (2013) https://doi.org/10.1117/12.2021246
Event: International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 2013, Singapore, Singapore
Abstract
High-speed shape measurement is required to analysis the behavior of a breaking object, a vibrating object or a rotating object. A shape measurement by a phase shifting method can measure the shape with high spatial resolution because the coordinates can be obtained pixel by pixel. The key-device is a grating projector. The projector can shift the projected grating in high-speed. So, authors proposed a light source stepping method using a linear LED device. A grating projector is composed with the linear LED and a Ronchi ruling. Grating pattern can be projected when the linear LED is turned on. The phase of the projected grating on the object can be shifted with changing the position of lighted linear LED easily and quickly. Authors call this method a light source stepping method. In this paper, a linear LED grating projector is developed. The characteristic of the linear LED grating projector such as the wavelength, directional characteristics, response are evaluated. The results show that this projector is useful for high-speed shape measurement.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Motoharu Fujigaki, Tsutomu Yokoyama, Yohei Oura, Toshimasa Sakaguchi, Daisuke Asai, and Yorinobu Murata "Characteristic evaluation of linear LED grating projector for high-speed shape measurement", Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87691J (22 June 2013); https://doi.org/10.1117/12.2021246
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KEYWORDS
Light emitting diodes

Projection systems

Light sources

Phase shifts

Diffraction gratings

Ronchi rulings

3D metrology

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