Measurement of two-dimensional distribution of temperature with surface plasmon resonance

Yen-Chang Chu; Kun-Huang Chen; Jiun-You Lin; Jing-Heng Chen; Huang-Sen Chiu; Tsung-Min Chen

doi:10.1117/12.2018985

22 June 2013 Measurement of two-dimensional distribution of temperature with surface plasmon resonance

Yen-Chang Chu, Kun-Huang Chen, Jiun-You Lin, Jing-Heng Chen, Huang-Sen Chiu, Tsung-Min Chen

Proceedings Volume 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013); 87692T (2013) https://doi.org/10.1117/12.2018985
Event: International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 2013, Singapore, Singapore

Abstract

This study proposes a simple method for measuring two-dimensional temperature distributions. Using the significant phase difference between p- and s-polarizations of the reflected light of a surface plasmon resonance (SPR) detector, the variation in the phase difference, which is caused by a variation in the temperature, can be accurately measured by phase-shifting interferometry. Then, by substituting the phase distribution into special derived equation, the temperature distribution can be determined. In order to show the feasibility of this method, different temperature distributions were measured. The measurement resolution is about 0.186°C. Due to the introduced common-path configuration and the high-sensitivity characteristic of surface plasmon resonance, this method should have merits of easy operation, high sensitivity, high accuracy and rapidly measurement.

Citation Download Citation

Yen-Chang Chu, Kun-Huang Chen, Jiun-You Lin, Jing-Heng Chen, Huang-Sen Chiu, and Tsung-Min Chen "Measurement of two-dimensional distribution of temperature with surface plasmon resonance", Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87692T (22 June 2013); https://doi.org/10.1117/12.2018985

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KEYWORDS

Surface plasmons

Temperature metrology

Sensors

Modulators

Phase interferometry

Prisms

CMOS cameras

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