22 June 2013 Measurement of two-dimensional distribution of temperature with surface plasmon resonance
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Proceedings Volume 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013); 87692T (2013) https://doi.org/10.1117/12.2018985
Event: International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 2013, Singapore, Singapore
Abstract
This study proposes a simple method for measuring two-dimensional temperature distributions. Using the significant phase difference between p- and s-polarizations of the reflected light of a surface plasmon resonance (SPR) detector, the variation in the phase difference, which is caused by a variation in the temperature, can be accurately measured by phase-shifting interferometry. Then, by substituting the phase distribution into special derived equation, the temperature distribution can be determined. In order to show the feasibility of this method, different temperature distributions were measured. The measurement resolution is about 0.186°C. Due to the introduced common-path configuration and the high-sensitivity characteristic of surface plasmon resonance, this method should have merits of easy operation, high sensitivity, high accuracy and rapidly measurement.
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Yen-Chang Chu, Yen-Chang Chu, Kun-Huang Chen, Kun-Huang Chen, Jiun-You Lin, Jiun-You Lin, Jing-Heng Chen, Jing-Heng Chen, Huang-Sen Chiu, Huang-Sen Chiu, Tsung-Min Chen, Tsung-Min Chen, } "Measurement of two-dimensional distribution of temperature with surface plasmon resonance", Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87692T (22 June 2013); doi: 10.1117/12.2018985; https://doi.org/10.1117/12.2018985
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