Determination of the uncertainty for phase noise delivered by an optoelectronic based system

Patrice Salzenstein; Ekaterina Pavlyuchenko

doi:10.1117/12.2016886

8 May 2013 Determination of the uncertainty for phase noise delivered by an optoelectronic based system

Patrice Salzenstein, Ekaterina Pavlyuchenko

Proceedings Volume 8772, Nonlinear Optics and Applications VII; 877217 (2013) https://doi.org/10.1117/12.2016886
Event: SPIE Optics + Optoelectronics, 2013, Prague, Czech Republic

Abstract

The aim of this work is to determine the uncertainty on phase noise results obtained by using a double delay line optoelectronic system operating at 1.55 μm wavelength and designed for microwave photonics applications. The use of cross-correlation increases the noise floor of the system. We present how the phase noise is determined and how the global uncertainty of this system is calculated according to the main guideline delivered by the Bureau International des Poids et Mesures (BIPM). Its leads to a global uncertainty better than 2 dB at 2 sigma.

Citation Download Citation

Patrice Salzenstein and Ekaterina Pavlyuchenko "Determination of the uncertainty for phase noise delivered by an optoelectronic based system", Proc. SPIE 8772, Nonlinear Optics and Applications VII, 877217 (8 May 2013); https://doi.org/10.1117/12.2016886

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