8 May 2013 Electronic structure of KTiOAsO4, a novel material for non-linear optical applications
Author Affiliations +
A high-quality KTiOAsO4 (KTA) single crystal has been successfully synthesized employing the high temperature solution growth technique with rotating and pooling. The XPS valence-band spectra have been measured for pristine and the 1.5 keV Ar+ ion-bombarded thin (001)KTA plate cut from the crystal part that was without any optical inhomogeneities or domain boundaries. The present XPS measurements have revealed the existence of two O 2s subbands on the XPS spectrum of the pristine (001)KTA surface. It has been established that 1.5 keV Ar+ ion bombardment of the (001)KTA surface causes the complete elimination of the O 2s sub-band related to oxygen atoms involved in the formation of Ti–O–As bonds in KTA. In addition, the XPS results reveal that such a treatment leads to a significant decrease of the relative intensity of the XPS As5+ 3d core-level spectrum and causes the formation of the additional As0 3d core-level spectrum in the topmost layer of the (001)KTA surface. The experimental data are compared to the results of the first-principles band-structure calculations of KTA.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Victor Atuchin, Oleg Y. Khyzhun, V.L. Bekenev, A.K. Sinelnichenko, L. I. Isaenko, S. A. Zhurkov, "Electronic structure of KTiOAsO4, a novel material for non-linear optical applications", Proc. SPIE 8772, Nonlinear Optics and Applications VII, 87721I (8 May 2013); doi: 10.1117/12.2017597; https://doi.org/10.1117/12.2017597


Gray-track damage in KTiOPO4 crystals
Proceedings of SPIE (June 24 1993)
Nonlinear optical properties of new KTiOPO4 isostructures
Proceedings of SPIE (December 01 1991)
Oxgen vacancy defects in PbTiO3 and BaTiO3 crystals a...
Proceedings of SPIE (August 08 2003)
Point defects in KTP and their possible role in laser...
Proceedings of SPIE (December 01 1991)
Quantum chemistry studies of the O K edge x ray...
Proceedings of SPIE (December 02 2008)

Back to Top