Proceedings Volume 8778 is from: Logo
SPIE OPTICS + OPTOELECTRONICS
15-18 April 2013
Prague, Czech Republic
Front Matter: Volume 8778
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 877801 (8 May 2013); doi: 10.1117/12.2030597
Status of Operational and Planned FEL Facilities and Source Developments
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 877803 (3 May 2013); doi: 10.1117/12.2017021
Scientific Applications and Their Instrumentation Requirements
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 877807 (3 May 2013); doi: 10.1117/12.2021806
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 877808 (3 May 2013); doi: 10.1117/12.2021298
Optics, Beam Transport Performance, Spatial and Coherence Properties
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 87780B (3 May 2013); doi: 10.1117/12.1518467
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 87780C (3 May 2013); doi: 10.1117/12.2019980
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 87780G (10 May 2013); doi: 10.1117/12.2020856
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 87780H (3 May 2013); doi: 10.1117/12.2016973
Diagnostics of FEL Radiation I: Electron Beam Diagnostics
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 87780J (3 May 2013); doi: 10.1117/12.2021569
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 87780M (3 May 2013); doi: 10.1117/12.2021531
Diagnostics of FEL Radiation II: X-ray Beam Diagnostics in the Time Domain
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 87780Q (3 May 2013); doi: 10.1117/12.2020488
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 87780R (3 May 2013); doi: 10.1117/12.2021572
FEL Instrumentation and Sample Related Issues
Poster Session
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 877810 (3 May 2013); doi: 10.1117/12.2016975
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 877811 (3 May 2013); doi: 10.1117/12.2017014
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 877813 (3 May 2013); doi: 10.1117/12.2019247
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 877814 (3 May 2013); doi: 10.1117/12.2020850
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 877816 (3 May 2013); doi: 10.1117/12.2021262
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 87781A (3 May 2013); doi: 10.1117/12.2021749
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 87781C (3 May 2013); doi: 10.1117/12.2021367
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 87781D (3 May 2013); doi: 10.1117/12.2021392
Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 87781G (3 May 2013); doi: 10.1117/12.2027029
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