3 May 2013 The impact of pulse duration on multiphoton ionization in the soft X-ray regime
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Abstract
At the soft X-ray free electron laser FLASH, multiphoton ionization of free atoms has been studied by ion time-of-flight spectroscopy. Depending on the multiphoton mechanism, the ionization processes are influenced in different ways by the FEL pulse duration. This feature has been used, e.g., to measure the pulse duration of FLASH in the femtosecond regime by non-linear autocorrelation. In the present contribution, the impact of pulse duration on multiphoton ionization is discussed with an emphasis on the distinction between sequential and non-sequential processes, and collective electron excitation as well.
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Mathias Richter, Mathias Richter, Andrey A. Sorokin, Andrey A. Sorokin, Kai Tiedtke, Kai Tiedtke, } "The impact of pulse duration on multiphoton ionization in the soft X-ray regime", Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 877808 (3 May 2013); doi: 10.1117/12.2021298; https://doi.org/10.1117/12.2021298
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