3 May 2013 Status of detector development for the European XFEL
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The European X-ray Free Electron Laser (XFEL.EU) will provide as-yet-unrivaled peak brilliance and ultrashort pulses of spatially coherent X-rays with a pulse length of less than 100 fs in the energy range between 0.25 and 25 keV. The high radiation intensity and ultra-short pulse duration will open a window for novel scientific techniques and will allow to explore new phenomena in biology, chemistry, material science, as well as matter at high energy density, atomic, ion and molecular physics. The variety of scientific applications and especially the unique XFEL.EU time structure require adequate instrumentation to be developed in order to exploit the full potential of the light source. To make optimal use of the unprecedented capabilities of the European XFEL and master these vast technological challenges, the European XFEL GmbH has started a detector R and D program. The technology concepts of the detector system presently under development are complementary in their performance and will cover the requirements of a large fraction of the scientific applications envisaged for the XFEL.EU facility. The actual status of the detector development projects which includes ultra-fast 2D imaging detectors, low repetition rate 2D detectors as well as strip detectors for e.g. spectroscopy applications and the infrastructure for the detectors’ calibration and tests will be presented. Furthermore, an overview of the forthcoming implementation phase of the European XFEL in terms of detector R and D will be given.
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Jolanta Sztuk-Dambietz, Jolanta Sztuk-Dambietz, Steffen Hauf, Steffen Hauf, Andreas Koch, Andreas Koch, Markus Kuster, Markus Kuster, Monica Turcato, Monica Turcato, "Status of detector development for the European XFEL", Proc. SPIE 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation, 87780U (3 May 2013); doi: 10.1117/12.2020773; https://doi.org/10.1117/12.2020773


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