7 May 2013 Analysis of parasitic effects in PICs using circuit simulation
Author Affiliations +
An understanding of parasitic effects is essential to maximize the performance of a Photonic Integrated Circuit (PIC). Using a circuit simulator, we are able to model mode conversion at the interface between straight and bent waveguides, parasitic reflections in multi-mode interference couplers (MMIs), interference between multiple modes, residual facet reflections, and reflections at junctions between components. Even though these effects are usually low in intensity, around -20 dB to -30 dB from the main signal level, they can still have a strong influence on the circuit performance. This is because the mentioned parasitic effects are coherent with the desired signal and interference between them is therefore a field effect. By analyzing three different circuits, and comparing the results to measurements, we show that these effects need to be carefully managed in order to ensure circuit performance. The circuits we investigate are a Fabry-Perot cavity, a Mach- Zehnder interferometric structure, and a Michelson interferometer. Especially residual reflections coming from angled facets and back-reflections in MMIs are shown to be the main parasitic effects in the investigated circuits.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Emil Kleijn, Emil Kleijn, Meint K. Smit, Meint K. Smit, Xaveer J. M. Leijtens, Xaveer J. M. Leijtens, "Analysis of parasitic effects in PICs using circuit simulation", Proc. SPIE 8781, Integrated Optics: Physics and Simulations, 878104 (7 May 2013); doi: 10.1117/12.2016829; https://doi.org/10.1117/12.2016829


A complete design flow for silicon photonics
Proceedings of SPIE (April 30 2014)
Large-scale silicon photonics circuit design
Proceedings of SPIE (November 12 2014)
A photonic integrated signal processor
Proceedings of SPIE (February 15 2017)

Back to Top