Numerical investigation of propagation constant in silicon nitride waveguides with different refractive index profiles

D. Bodenmüller; J. M. Chavez Boggio; M. Böhm; T. Fremberg; R. Haynes; M. M. Roth

doi:10.1117/12.2017323

7 May 2013 Numerical investigation of propagation constant in silicon nitride waveguides with different refractive index profiles

D. Bodenmüller, J. M. Chavez Boggio, M. Böhm, T. Fremberg, R. Haynes, M. M. Roth

Author Affiliations +

Proceedings Volume 8781, Integrated Optics: Physics and Simulations; 87811B (2013) https://doi.org/10.1117/12.2017323
Event: SPIE Optics + Optoelectronics, 2013, Prague, Czech Republic

Abstract

The engineering of the propagation constant in integrated silicon nitride waveguides is numerically investigated. We compare several geometrical designs and show that fairly large chromatic dispersion control is obtained when the transversal dimensions are modified.

Citation Download Citation

D. Bodenmüller, J. M. Chavez Boggio, M. Böhm, T. Fremberg, R. Haynes, and M. M. Roth "Numerical investigation of propagation constant in silicon nitride waveguides with different refractive index profiles", Proc. SPIE 8781, Integrated Optics: Physics and Simulations, 87811B (7 May 2013); https://doi.org/10.1117/12.2017323

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