24 January 2013 Test system of current pulse in phase change memory devices
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Proceedings Volume 8782, 2012 International Workshop on Information Storage and Ninth International Symposium on Optical Storage; 878214 (2013) https://doi.org/10.1117/12.2018473
Event: 2012 International Workshop on Information Data Storage and Ninth International Symposium on Optical Storage, 2012, Shanghai, China
Abstract
Up to now, there is no direct test system of current pulse in phase change memory (PCM). The traditional test system uses direct current or voltage pulses to do the set operation and voltage pulses to do reset operation. In this work, a new test system is introduced. This system can give current source pulses to the PCM device to do set operation. The test results are presented and analyzed.
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Yuchan Wang, Xiaogang Chen, Shunfen Li, Yifeng Chen, Linhai Xu, Yueqing Wang, Mi Zhou, Gezi Li, Zhitang Song, "Test system of current pulse in phase change memory devices", Proc. SPIE 8782, 2012 International Workshop on Information Storage and Ninth International Symposium on Optical Storage, 878214 (24 January 2013); doi: 10.1117/12.2018473; https://doi.org/10.1117/12.2018473
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