24 January 2013 Design of a novel pulse current source chip used in phase change memory testing system
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Proceedings Volume 8782, 2012 International Workshop on Information Storage and Ninth International Symposium on Optical Storage; 878216 (2013) https://doi.org/10.1117/12.2018715
Event: 2012 International Workshop on Information Data Storage and Ninth International Symposium on Optical Storage, 2012, Shanghai, China
Abstract
Circuit design of an adaptable pulse current source chip is presented in this paper. The pulse current source is supposed to be used to supply Reset and Set current in the phase change memory chip testing system. The value and width of the pulse current source are variable, with the maximum value of 10mA and minimum width of 50ns. Two pulse currents output simultaneously with the same width but different values. A voltage pulse input is used to control the width of pulse current output. This high frequency voltage pulse could induce noise jamming to the inner circuits. To avoid this, a novel ESD and bonding structure is proposed.
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Qian Wang, Houpeng Chen, Weiyi Xu, Xiao Hong, Daolin Cai, Rong Jin, Zhitang Song, "Design of a novel pulse current source chip used in phase change memory testing system", Proc. SPIE 8782, 2012 International Workshop on Information Storage and Ninth International Symposium on Optical Storage, 878216 (24 January 2013); doi: 10.1117/12.2018715; https://doi.org/10.1117/12.2018715
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