Test case set generation method on MC/DC based on binary tree

Jun-jie Wang; Bo Zhang; Yuan Chen

doi:10.1117/12.2021188

13 March 2013 Test case set generation method on MC/DC based on binary tree

Jun-jie Wang, Bo Zhang, Yuan Chen

Proceedings Volume 8783, Fifth International Conference on Machine Vision (ICMV 2012): Computer Vision, Image Analysis and Processing; 87831P (2013) https://doi.org/10.1117/12.2021188
Event: Fifth International Conference on Machine Vision (ICMV 12), 2012, Wuhan, China

Abstract

Exploring efficient, reliable test case design methods has been tester pursuit of the goal. Along with the aerospace software logic complexity of improving and software scale enlarging, this requirement also gets more compelling. Test case design techniques suited for MC/DC improved test case design efficiency, increase the test coverage. It is suitable to test the software that logical relationship is complicated comparatively. Some software test tools provide the function to calculate the test coverage. And it can assess the test cases whether on the MC/DC or not. But the software tester needs the reverse thinking. The paper puts forward that design the test case by Unique-cause and Masking approach. And it proposes automatic generation method of test case on MC/DC. It improved the efficiency and correctness of generation the test case set on DC/DC.

Citation Download Citation

Jun-jie Wang, Bo Zhang, and Yuan Chen "Test case set generation method on MC/DC based on binary tree", Proc. SPIE 8783, Fifth International Conference on Machine Vision (ICMV 2012): Computer Vision, Image Analysis and Processing, 87831P (13 March 2013); https://doi.org/10.1117/12.2021188

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