18 November 2013 White light interferometry applied to wavelength calibration of spectrometers
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Proceedings Volume 8785, 8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications; 87854G (2013) https://doi.org/10.1117/12.2026187
Event: 8th Ibero American Optics Meeting/11th Latin American Meeting on Optics, Lasers, and Applications, 2013, Porto, Portugal
Abstract
In this work, white light interferometry is applied to perform wavelength calibration of a dispersive spectrometer .The relation between wavelength and position in the spectrometer detector is obtained from the wavelength-dependent phase difference at the output of the interferometer. In the proposed method, no suppositions are made about the spectrum of the illumination source; it is only required to make a simple assumption about dispersion in the spectrometer to be measured and to perform a Taylor expansion of the phase difference. A sample of calibration of a home-made spectrometer serves to discuss different issues that affect the calibration.
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Héctor González-Núñez, Raúl de la Fuente, "White light interferometry applied to wavelength calibration of spectrometers", Proc. SPIE 8785, 8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications, 87854G (18 November 2013); doi: 10.1117/12.2026187; https://doi.org/10.1117/12.2026187
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