18 November 2013 White light interferometry applied to wavelength calibration of spectrometers
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Proceedings Volume 8785, 8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications; 87854G (2013) https://doi.org/10.1117/12.2026187
Event: 8th Ibero American Optics Meeting/11th Latin American Meeting on Optics, Lasers, and Applications, 2013, Porto, Portugal
Abstract
In this work, white light interferometry is applied to perform wavelength calibration of a dispersive spectrometer .The relation between wavelength and position in the spectrometer detector is obtained from the wavelength-dependent phase difference at the output of the interferometer. In the proposed method, no suppositions are made about the spectrum of the illumination source; it is only required to make a simple assumption about dispersion in the spectrometer to be measured and to perform a Taylor expansion of the phase difference. A sample of calibration of a home-made spectrometer serves to discuss different issues that affect the calibration.
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Héctor González-Núñez, Héctor González-Núñez, Raúl de la Fuente, Raúl de la Fuente, } "White light interferometry applied to wavelength calibration of spectrometers", Proc. SPIE 8785, 8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications, 87854G (18 November 2013); doi: 10.1117/12.2026187; https://doi.org/10.1117/12.2026187
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